IP protection category |
IP 40 |
Positioning speed |
0.5; 1.0 |
Measuring principle |
Stylus method |
Probe |
BFW skidless system |
Measuring range mm |
+/- 250 µm (up to +/- 750 µm with 3x probe arm length) |
Profile resolution |
Measuring range +/- 250 µm: 8 nm
Measuring range +/- 25 µm: 0.8 nm |
Filter according to ISO/JIS |
Gaussian filter as per ISO 11562
Filter as per ISO 13565 |
Cutoff Ic according to ISO/JIS |
0,08 mm , 0,25 mm , 0,8 mm , 2,5 mm , automatical , variable |
Number n of sampling length according to ISO/JIS |
1-5 |
Contacting speeds |
0.2 mm/s; 1.0 mm/s |
Stylus |
2 µm |
Measuring force (N) |
0.75 mN |
Weight drive unit |
approx. 0.9 kg |
Weight measuring instrument |
approx. 1.0 kg |
Surface parameters |
Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085) |